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DC Field | Value | Language |
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dc.contributor.author | Hui, Yik Yu | en_US |
dc.date.accessioned | 2012-08-27T00:46:57Z | |
dc.date.accessioned | 2017-09-19T09:12:52Z | |
dc.date.accessioned | 2019-02-12T07:30:36Z | - |
dc.date.available | 2012-08-27T00:46:57Z | |
dc.date.available | 2017-09-19T09:12:52Z | |
dc.date.available | 2019-02-12T07:30:36Z | - |
dc.date.issued | 2012 | en_US |
dc.identifier.other | 2012eehyy474 | en_US |
dc.identifier.uri | http://144.214.8.231/handle/2031/6662 | - |
dc.description.abstract | The objective of this project is to design a 54/74 IC Tester. By pressing a button on the test board, it can automatically identify the number of pins of IC, differentiate between LS and HC families and its part number within a second. Furthermore, the tester can be worked alone or connected to a PC for detailed information of the IC under test. The overall project can be divided into three parts. 1. The first part is an external board with all hardware, this includes a microcontroller ATmega16L, an IC test socket, a LCD display, and an USB 2.0 interface to PC. 2. The second part is the microcontroller's programming design which uses C language to (i) build up the test library for each individual 54/74 IC, (ii) display the test result in LCD, (iii) communicate with PC. 3. The third part is the user interface in PC which uses Visual Basic 2008 to display detailed information of the IC under test, e.g. the pin connection and the detailed specifications. | en_US |
dc.rights | This work is protected by copyright. Reproduction or distribution of the work in any format is prohibited without written permission of the copyright owner. | en_US |
dc.rights | Access is restricted to CityU users. | en_US |
dc.title | 54/74 IC Tester | en_US |
dc.contributor.department | Department of Electronic Engineering | en_US |
dc.description.supervisor | Supervisor: Dr. Wong, W K; Assessor: Dr. Sung, Albert C W | en_US |
Appears in Collections: | Electrical Engineering - Undergraduate Final Year Projects |
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