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Please use this identifier to cite or link to this item: http://dspace.cityu.edu.hk/handle/2031/5662
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dc.contributor.authorSung, Kwok Hoen_US
dc.date.accessioned2010-02-10T06:13:02Z
dc.date.accessioned2017-09-19T09:11:21Z
dc.date.accessioned2019-02-12T07:28:36Z-
dc.date.available2010-02-10T06:13:02Z
dc.date.available2017-09-19T09:11:21Z
dc.date.available2019-02-12T07:28:36Z-
dc.date.issued2009en_US
dc.identifier.other2009eeskh214en_US
dc.identifier.urihttp://144.214.8.231/handle/2031/5662-
dc.description.abstractSynchronization is an important task in orthogonal frequency division multiplexing (OFDM). Typical synchronization error includes carrier frequency offset (CFO), carrier phase offset, sampling clock offset (SCO) and symbol timing offset have been addressed. They will cause performance (symbol error ratio SER) degradation. In this project, we study the effect of synchronization error for BPSK, QPSK, 16QAM, 64QAM and 256QAM systems under an Additive White Gaussian Channel (AWGN). Various parameters like the number of carriers and sampling rate (i.e. the oversampling factor) have been addressed. Theoretical analysis has been performed and verified with computer simulations using MATLAB. Exact theoretical evaluation of SER is performed for symbol timing offset and Monte Carlo method is used for that of CFO and SCO because it appears impossible to evaluate the exact SER when the number of modulation level and number of carrier is above 16. Finally, two phase estimator techniques are proposed to restore the phase rotation and improve the overall SER performance.en_US
dc.rightsThis work is protected by copyright. Reproduction or distribution of the work in any format is prohibited without written permission of the copyright owner.en_US
dc.rightsAccess is restricted to CityU users.en_US
dc.titlePerformance degradation due to the synchronization error in OFDMen_US
dc.contributor.departmentDepartment of Electronic Engineeringen_US
dc.description.supervisorSupervisor: Dr. Wong, W K ., Assessor: Prof. Zhang, Keith Q Ten_US
Appears in Collections:Electrical Engineering - Undergraduate Final Year Projects 

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